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A Study of the Shallow Electron Traps at the 4H-SiC/SiO~2 Interface
A Study of the Shallow Electron Traps at the 4H-SiC/SiO~2 Interface
A Study of the Shallow Electron Traps at the 4H-SiC/SiO~2 Interface
Olafsson, H. O. (Autor:in) / Sveinbjornsson, E. O. (Autor:in) / Rudenko, T. E. (Autor:in) / Kilchytska, V. I. (Autor:in) / Tyagulski, I. P. (Autor:in) / Osiyuk, I. N. (Autor:in) / Bergman, P. / Janzen, E.
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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