Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
An advanced technique for measuring minority-carrier parameters and defect properties of semiconductors
An advanced technique for measuring minority-carrier parameters and defect properties of semiconductors
An advanced technique for measuring minority-carrier parameters and defect properties of semiconductors
Ahrenkiel, R. K. (Autor:in) / Johnston, S. W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 161-172
01.01.2003
12 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Theoretical aspects of the minority carrier recombination at dislocations in semiconductors
| British Library Online Contents | 1996
Minority Carrier Lifetime Measurements in 6H-SiC Using the Photoconductive Decay Technique
| British Library Online Contents | 1998
Defect Studies in Semiconductors
| British Library Online Contents | 2001
| British Library Online Contents | 2003
Defect analysis in organic semiconductors
| British Library Online Contents | 2006