Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Investigation of minority carrier diffusion length in shallow junctions by angle-resolved illumination technique
Investigation of minority carrier diffusion length in shallow junctions by angle-resolved illumination technique
Investigation of minority carrier diffusion length in shallow junctions by angle-resolved illumination technique
Parretta, A. (Autor:in) / Grillo, P. (Autor:in) / Tucci, M. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 179-183
01.01.2003
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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