Minority Carrier Lifetime Measurements in Specific Epitaxial 4H-SiC Layers by the Microwave Photoconductivity Decay

Ottaviani, L. / Palais, O. / Barakel, D. et al. | British Library Online Contents | 2009

Carrier Lifetime Analysis by Microwave Photoconductive Decay (mu-PCD) for 4H SiC Epitaxial Wafers

Chung, G. Y. / Loboda, M. J. / MacMillan, M. F. et al. | British Library Online Contents | 2007

Minority carrier lifetime and metallic-impurity mapping in silicon wafers

Palais, O. / Martinuzzi, S. / Simon, J. J. | British Library Online Contents | 2001

Cathodoluminescence assessment of annealed silicon and a novel technique for estimating minority carrier lifetime in silicon

Fraser, K. J. / Falster, R. J. / Wilshaw, P. R. | British Library Online Contents | 2009

Mapping of minority carrier lifetime and mobility in imperfect silicon wafers

Palais, O. / Clerc, L. / Arcari, A. et al. | British Library Online Contents | 2003