Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Characterisation of oxygen and oxygen-related defects in highly- and lowly-doped silicon
Simoen, E. (Autor:in) / Claeys, C. (Autor:in) / Loo, R. (Autor:in) / De Gryse, O. (Autor:in) / Clauws, P. (Autor:in) / Job, R. (Autor:in) / Ulyashin, A. G. (Autor:in) / Fahrner, W. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 207-212
01.01.2003
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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