Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces
Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces
Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces
Smith, R. J. (Autor:in) / Ramana, C. V. (Autor:in) / Choi, B. s. (Autor:in) / Saleh, A. A. (Autor:in) / Shivaparan, N. R. (Autor:in) / Shutthanandan, V. (Autor:in)
APPLIED SURFACE SCIENCE ; 219 ; 28-38
01.01.2003
11 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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