Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces: Fid-Bau Portal

Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces

Smith, R. J. / Ramana, C. V. / Choi, B. s. / Saleh, A. A. / Shivaparan, N. R. / Shutthanandan, V.

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Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces

Smith, R. J. / Ramana, C. V. / Choi, B. s. / Saleh, A. A. / Shivaparan, N. R. / Shutthanandan, V.

Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces

Smith, R. J. / Ramana, C. V. / Choi, B. s. / Saleh, A. A. / Shivaparan, N. R. / Shutthanandan, V.

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Title:

Using MeV ion backscattering/channeling and MC simulations to characterize the composition and structure of buried metal-metal interfaces

Contributors:

Smith, R. J. (author) / Ramana, C. V. (author) / Choi, B. s. (author) / Saleh, A. A. (author) / Shivaparan, N. R. (author) / Shutthanandan, V. (author)

Published in:

APPLIED SURFACE SCIENCE ; 219 ; 28-38

Publication date:

2003-01-01

Size:

11 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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