Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Surface characteristics of MOCVD grown TiO2 films by atomic force microscopy
Surface characteristics of MOCVD grown TiO2 films by atomic force microscopy
Surface characteristics of MOCVD grown TiO2 films by atomic force microscopy
Park, Y. B. (Autor:in) / Ahn, K. H. (Autor:in) / Park, D. W. (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 22 ; 1325-1328
01.01.2003
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Surface morphologies of MOCVD-grown GaN films on sapphire studied by scanning tunneling microscopy
British Library Online Contents | 2002
|Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy
British Library Online Contents | 2000
|Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy
British Library Online Contents | 2008
|British Library Online Contents | 2015
|Surface nanoscale imaging of collagen thin films by Atomic Force Microscopy
British Library Online Contents | 2013
|