Surface morphologies of MOCVD-grown GaN films on sapphire studied by scanning tunneling microscopy

Zhou, J. / Reddic, J. E. / Sinha, M. et al. | British Library Online Contents | 2002

Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy

Pang, C. L. / Raza, H. / Haycock, S. A. et al. | British Library Online Contents | 2000

Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy

Kaczmarek, D. / Domaradzki, J. / Wojcieszak, D. et al. | British Library Online Contents | 2008

Memory programming of TiO2-x films by Conductive Atomic Force Microscopy evidencing filamentary resistive switching

Bousoulas, P. / Giannopoulos, J. / Giannakopoulos, K. et al. | British Library Online Contents | 2015

Atomic-force microscopy of the surface of crystals and bismuth films

Grabov, V.M. / Demidov, E.V. / Komarov, V.A. | British Library Online Contents | 2009