Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry
Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry
Measurement of full-field curvature and geometrical instability of thin film-substrate systems through CGS interferometry
Park, T. S. (Autor:in) / Suresh, S. (Autor:in) / Rosakis, A. J. (Autor:in) / Ryu, J. (Autor:in)
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS ; 51 ; 2191-2211
01.01.2003
21 pages
Aufsatz (Zeitschrift)
Englisch
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