Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy
Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy
Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy
Bonse, J. (Autor:in) / Brzezinka, K. W. (Autor:in) / Meixner, A. J. (Autor:in)
APPLIED SURFACE SCIENCE ; 221 ; 215-230
01.01.2004
16 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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