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    Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy

    New search for: Bonse, J.
    New search for: Brzezinka, K. W.
    New search for: Meixner, A. J.

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    Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy

    New search for: Bonse, J.
    New search for: Brzezinka, K. W.
    New search for: Meixner, A. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy

    New search for: Bonse, J.
    New search for: Brzezinka, K. W.
    New search for: Meixner, A. J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
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    Document information
    Title:

    Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy

    Contributors:

    Bonse, J. (author) / Brzezinka, K. W. (author) / Meixner, A. J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 221 ; 215-230

    Publication date:

    2004-01-01

    Size:

    16 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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