Deep level defects in H^+ implanted 6H-SiC epilayers and in silicon carbide on insulator structures

Hugonnard-Bruyere, E. / Lauer, V. / Guillot, G. et al. | British Library Online Contents | 1999

Intrinsic Defects in Silicon Carbide Polytypes

Son, N. T. / Hai, P. N. / Janzen, E. | British Library Online Contents | 2001

Characterisation and Defects in Silicon Carbide

Bergman, J. P. / Jakobsson, H. / Storasta, L. et al. | British Library Online Contents | 2002

Growth of silicon carbide: process-related defects

Yakimova, R. / Syvajarvi, M. / Iakimov, T. et al. | British Library Online Contents | 2001

EPR and ENDOR of Defects in Silicon Carbide

Spaeth, J.-M. / Greulich-Weber, S. / Maerz, M. et al. | British Library Online Contents | 1997