Identities of the Deep Level Defects E~1/E~2 in 6H Silicon Carbide: Fid-Bau Portal

Identities of the Deep Level Defects E~1/E~2 in 6H Silicon Carbide

Ling, C. C. / Chen, X. D. / Gong, M. / Weng, H. M. / Hang, D. S. / Beling, C. D. / Fung, S. / Lam, T. W. / Lam, C. H.

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Identities of the Deep Level Defects E~1/E~2 in 6H Silicon Carbide

Ling, C. C. / Chen, X. D. / Gong, M. / Weng, H. M. / Hang, D. S. / Beling, C. D. / Fung, S. / Lam, T. W. / Lam, C. H.

Identities of the Deep Level Defects E~1/E~2 in 6H Silicon Carbide

Ling, C. C. / Chen, X. D. / Gong, M. / Weng, H. M. / Hang, D. S. / Beling, C. D. / Fung, S. / Lam, T. W. / Lam, C. H.

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Document information

Title:

Identities of the Deep Level Defects E~1/E~2 in 6H Silicon Carbide

Contributors:

Ling, C. C. (author) / Chen, X. D. (author) / Gong, M. (author) / Weng, H. M. (author) / Hang, D. S. (author) / Beling, C. D. (author) / Fung, S. (author) / Lam, T. W. (author) / Lam, C. H. (author)

Published in:

MATERIALS SCIENCE FORUM ; 445/446 ; 135-137

Publication date:

2004-01-01

Size:

3 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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Son, N. T. / Hai, P. N. / Janzen, E. | British Library Online Contents | 2001

Characterisation and Defects in Silicon Carbide

Bergman, J. P. / Jakobsson, H. / Storasta, L. et al. | British Library Online Contents | 2002

Growth of silicon carbide: process-related defects

Yakimova, R. / Syvajarvi, M. / Iakimov, T. et al. | British Library Online Contents | 2001

EPR and ENDOR of Defects in Silicon Carbide

Spaeth, J.-M. / Greulich-Weber, S. / Maerz, M. et al. | British Library Online Contents | 1997