Characterizing Native Point Defects in ZnO Bulk by Positron Annihilation Spectroscopy

Peng, C.X. / Weng, H.M. / Wang, K.F. et al. | British Library Online Contents | 2009

Positron annihilation and scanning tunneling microscopy used to characterise defects in highly Si-doped GaAs

Gebauer, J. / Krause-Rehberg, R. / Domke, C. et al. | British Library Online Contents | 1997

Equilibrium Vacancies in Te-Doped GaAs Studied by Positron Annihilation

Gebauer, J. / Krause-Rehberg, R. / Lausmann, M. et al. | British Library Online Contents | 1997

Native and Irradiation-Induced Defects in SiO~2 Structures Studied by Positron Annihilation Techniques

Rivera, A. / Montilla, I. / Garcia, A. A. et al. | British Library Online Contents | 2001

Positron Annihilation at Planar Defects in Oxides

Kuriplach, J. / Melikhova, O. / Cizek, J. et al. | British Library Online Contents | 2013