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Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy
Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy
Hydrogen trapping by defects in semiconductors studied by anelastic spectroscopy
Palumbo, O. (Autor:in) / Cantelli, R. (Autor:in) / Cordero, F. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING A ; 370 ; 114-117
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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