Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Raman microprobe mapping of residual microstresses in 3C-SiC film epitaxial lateral grown on patterned Si(1 1 1)
Raman microprobe mapping of residual microstresses in 3C-SiC film epitaxial lateral grown on patterned Si(1 1 1)
Raman microprobe mapping of residual microstresses in 3C-SiC film epitaxial lateral grown on patterned Si(1 1 1)
Lee, C. J. (Autor:in) / Pezzotti, G. (Autor:in) / Okui, Y. (Autor:in) / Nishino, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 228 ; 10-16
01.01.2004
7 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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