Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr2O3 thin films

Kemdehoundja, M. / Grosseau-Poussard, J. L. / Dinhut, J. F. | British Library Online Contents | 2010

Mapping residual stress using optical microprobe in alumina films formed by thermal oxidation of NiAl

Atkinson, A. / Clarke, D. R. / Webb, S. J. | British Library Online Contents | 1998

Raman microprobe mapping of residual microstresses in 3C-SiC film epitaxial lateral grown on patterned Si(1 1 1)

Lee, C. J. / Pezzotti, G. / Okui, Y. et al. | British Library Online Contents | 2004

Direct measurement of crack shielding in ceramics by the application of Raman microprobe spectroscopy

Belnap, J. D. / Tsai, J.-F. / Shetty, D. K. | British Library Online Contents | 1994

Raman microprobe analysis of strained polysilicon deposited layers

Talaat, H. / Negm, S. / Schaffer, H. E. et al. | British Library Online Contents | 1998