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High-resolution X-ray photoelectron spectroscopy of AlxGa1-xSb
High-resolution X-ray photoelectron spectroscopy of AlxGa1-xSb
High-resolution X-ray photoelectron spectroscopy of AlxGa1-xSb
Ramelan, A. H. (Autor:in) / Butcher, K. S. (Autor:in) / Goldys, E. M. (Autor:in) / Tansley, T. L. (Autor:in)
APPLIED SURFACE SCIENCE ; 229 ; 263-267
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|