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High-resolution X-ray photoelectron spectroscopy of AlxGa1-xSb
High-resolution X-ray photoelectron spectroscopy of AlxGa1-xSb
High-resolution X-ray photoelectron spectroscopy of AlxGa1-xSb
Ramelan, A. H. (author) / Butcher, K. S. (author) / Goldys, E. M. (author) / Tansley, T. L. (author)
APPLIED SURFACE SCIENCE ; 229 ; 263-267
2004-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|Band alignment of SiO2/(AlxGa1-x)2O3 (0≤x≤0.49) determined by X-ray photoelectron spectroscopy
British Library Online Contents | 2018
|