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EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC
EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC
EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC
Umeda, T. (Autor:in) / Ishitsuka, Y. (Autor:in) / Isoya, J. (Autor:in) / Morishita, N. (Autor:in) / Ohshima, T. (Autor:in) / Kamiya, T. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 465-468
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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