EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC: Fid-Bau Portal

EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC

Umeda, T. / Ishitsuka, Y. / Isoya, J. / Morishita, N. / Ohshima, T. / Kamiya, T.

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EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC

Umeda, T. / Ishitsuka, Y. / Isoya, J. / Morishita, N. / Ohshima, T. / Kamiya, T.

EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC

Umeda, T. / Ishitsuka, Y. / Isoya, J. / Morishita, N. / Ohshima, T. / Kamiya, T.

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Title:

EPR and Pulsed ENDOR Study of E16 and Related Defects in 4H-SiC

Contributors:

Umeda, T. (author) / Ishitsuka, Y. (author) / Isoya, J. (author) / Morishita, N. (author) / Ohshima, T. (author) / Kamiya, T. (author)

Published in:

MATERIALS SCIENCE FORUM ; 457/460 ; 465-468

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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