Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes
Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes
Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes
Stahlbush, R. E. (Autor:in) / Twigg, M. E. (Autor:in) / Irvine, K. G. (Autor:in) / Sumakeris, J. J. (Autor:in) / Chow, T. P. (Autor:in) / Losee, P. A. (Autor:in) / Zhu, L. (Autor:in) / Tang, Y. (Autor:in) / Wang, W. (Autor:in)
MATERIALS SCIENCE FORUM ; 457/460 ; 533-536
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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