Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes: Fid-Bau Portal

Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes

Stahlbush, R. E. / Twigg, M. E. / Irvine, K. G. / Sumakeris, J. J. / Chow, T. P. / Losee, P. A. / Zhu, L. / Tang, Y. / Wang, W.

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Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes

Stahlbush, R. E. / Twigg, M. E. / Irvine, K. G. / Sumakeris, J. J. / Chow, T. P. / Losee, P. A. / Zhu, L. / Tang, Y. / Wang, W.

Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes

Stahlbush, R. E. / Twigg, M. E. / Irvine, K. G. / Sumakeris, J. J. / Chow, T. P. / Losee, P. A. / Zhu, L. / Tang, Y. / Wang, W.

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Document information

Title:

Stacking Fault Formation Sites and Growth in Thick-Epi SiC PiN Diodes

Contributors:

Stahlbush, R. E. (author) / Twigg, M. E. (author) / Irvine, K. G. (author) / Sumakeris, J. J. (author) / Chow, T. P. (author) / Losee, P. A. (author) / Zhu, L. (author) / Tang, Y. (author) / Wang, W. (author)

Published in:

MATERIALS SCIENCE FORUM ; 457/460 ; 533-536

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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