Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy: Fid-Bau Portal

Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

Hanel, K. / Sohnchen, S. / Lukas, S. / Beernink, G. / Birkner, A. / Strunskus, T. / Witte, G. / Woll, C.

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Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

Hanel, K. / Sohnchen, S. / Lukas, S. / Beernink, G. / Birkner, A. / Strunskus, T. / Witte, G. / Woll, C.

Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

Hanel, K. / Sohnchen, S. / Lukas, S. / Beernink, G. / Birkner, A. / Strunskus, T. / Witte, G. / Woll, C.

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Titel:

Organic molecular-beam deposition of perylene on Cu(110): Results from near-edge x-ray absorption spectroscopy, x-ray photoelectron spectroscopy, and atomic force microscopy

Beteiligte:

Hanel, K. (Autor:in) / Sohnchen, S. (Autor:in) / Lukas, S. (Autor:in) / Beernink, G. (Autor:in) / Birkner, A. (Autor:in) / Strunskus, T. (Autor:in) / Witte, G. (Autor:in) / Woll, C. (Autor:in)

Erschienen in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE-. ; 19 ; 2049-2056

Erscheinungsdatum:

01.01.2004

Format / Umfang:

8 pages

ISSN:

0884-2914

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

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