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Membrane surface modification and characterization by X-ray photoelectron spectroscopy, atomic force microscopy and contact angle measurements
Membrane surface modification and characterization by X-ray photoelectron spectroscopy, atomic force microscopy and contact angle measurements
Membrane surface modification and characterization by X-ray photoelectron spectroscopy, atomic force microscopy and contact angle measurements
Khayet, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 238 ; 269-272
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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