Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
Gnaser, H. (Autor:in) / Golser, R. (Autor:in) / Kutschera, W. (Autor:in) / Priller, A. (Autor:in) / Steier, P. (Autor:in) / Vockenhuber, C. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 117-121
01.01.2004
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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