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Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
Detection of sputtered molecular doubly charged anions: a comparison of secondary-ion mass spectrometry (SIMS) and accelerator mass spectrometry (AMS)
Gnaser, H. (author) / Golser, R. (author) / Kutschera, W. (author) / Priller, A. (author) / Steier, P. (author) / Vockenhuber, C. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 117-121
2004-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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