Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
Li, Z. (Autor:in) / Rickman, R. D. (Autor:in) / Verkhoturov, S. V. (Autor:in) / Schweikert, E. A. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 328-331
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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