A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
Layer-by-layer characterization of ultrathin films with secondary ion mass spectrometry
Li, Z. (author) / Rickman, R. D. (author) / Verkhoturov, S. V. (author) / Schweikert, E. A. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 328-331
2004-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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