Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS

Hongo, C. / Tomita, M. / Takenaka, M. et al. | British Library Online Contents | 2003

SIMS backside depth profiling of ultra shallow implants

Yeo, K. L. / Wee, A. T. / See, A. et al. | British Library Online Contents | 2003

Toward accurate in-depth profiling of As and P ultra-shallow implants by SIMS

Merkulov, A. / de Chambost, E. / Schuhmacher, M. et al. | British Library Online Contents | 2004

Ultra Shallow Depth Profiling with SIMS

Ehrke, H.-U. | British Library Online Contents | 2008

Ultralow-energy SIMS for shallow semiconductor depth profiling

Chanbasha, A. R. / Wee, A. T. | British Library Online Contents | 2008