Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
O~2^+ versus Cs^+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices
O~2^+ versus Cs^+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices
O~2^+ versus Cs^+ for high depth resolution depth profiling of III-V nitride-based semiconductor devices
Kachan, M. (Autor:in) / Hunter, J. (Autor:in) / Kouzminov, D. (Autor:in) / Pivovarov, A. (Autor:in) / Gu, J. (Autor:in) / Stevie, F. (Autor:in) / Griffis, D. (Autor:in)
APPLIED SURFACE SCIENCE ; 231/232 ; 684-687
01.01.2004
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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