Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Towards quantitative depth profiling with high spatial and high depth resolution
Towards quantitative depth profiling with high spatial and high depth resolution
Towards quantitative depth profiling with high spatial and high depth resolution
Vanhove, N. (Autor:in) / Lievens, P. (Autor:in) / Vandervorst, W. (Autor:in)
APPLIED SURFACE SCIENCE ; 255 ; 1360-1363
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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