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Film thickness degradation of Au/GaN Schottky contact characteristics
Film thickness degradation of Au/GaN Schottky contact characteristics
Film thickness degradation of Au/GaN Schottky contact characteristics
Wang, K. (Autor:in) / Wang, R. X. (Autor:in) / Fung, S. (Autor:in) / Beling, C. D. (Autor:in) / Chen, X. D. (Autor:in) / Huang, Y. (Autor:in) / Li, S. (Autor:in) / Xu, S. J. (Autor:in) / Gong, M. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 117 ; 21-25
01.01.2005
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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