Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Film thickness degradation of Au/GaN Schottky contact characteristics

    New search for: Wang, K.
    New search for: Wang, R. X.
    New search for: Fung, S.
    New search for: Beling, C. D.
    New search for: Chen, X. D.
    New search for: Huang, Y.
    New search for: Li, S.
    New search for: Xu, S. J.
    New search for: Gong, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Film thickness degradation of Au/GaN Schottky contact characteristics

    New search for: Wang, K.
    New search for: Wang, R. X.
    New search for: Fung, S.
    New search for: Beling, C. D.
    New search for: Chen, X. D.
    New search for: Huang, Y.
    New search for: Li, S.
    New search for: Xu, S. J.
    New search for: Gong, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Film thickness degradation of Au/GaN Schottky contact characteristics

    New search for: Wang, K.
    New search for: Wang, R. X.
    New search for: Fung, S.
    New search for: Beling, C. D.
    New search for: Chen, X. D.
    New search for: Huang, Y.
    New search for: Li, S.
    New search for: Xu, S. J.
    New search for: Gong, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Film thickness degradation of Au/GaN Schottky contact characteristics

    Contributors:

    Wang, K. (author) / Wang, R. X. (author) / Fung, S. (author) / Beling, C. D. (author) / Chen, X. D. (author) / Huang, Y. (author) / Li, S. (author) / Xu, S. J. (author) / Gong, M. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 117 ; 21-25

    Publication date:

    2005-01-01

    Size:

    5 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Improvement of Schottky Contact Characteristics by Anodic Oxidation of 4H-SiC

    Kimura, M. / Kato, M. / Ichimura, M. | British Library Online Contents | 2011

    Quantitative analysis of degradation in Schottky diode characteristics induced by single ion implantation

    Koyama, M. / Akita, Y. / Cheong, C. et al. | British Library Online Contents | 1996

    Stability of Molybdenum Schottky Contact to Silicon Carbide

    Nishikawa, K. / Shimizu, M. / Foster, B. et al. | British Library Online Contents | 2001

    Characterization of Schottky Contact on p-type 6H-SiC

    Kamimura, K. / Okada, S. / Ito, H. et al. | British Library Online Contents | 2000

    Effect of insulating-film-thickness nonuniformity on tunnel characteristics

    Chow, C.K. | Engineering Index Backfile | 1963

    Back to top