TEM Studies of Grain Boundary Structure in a Cast Polycrystalline Silicon

Kuchiwaki, I. / Hirabayashi, T. / Fukushima, H. | British Library Online Contents | 2005

Interface Defects of Bonded Silicon Wafers

Reiche, M. / Tong, Q.-Y. / Goesele, U. et al. | British Library Online Contents | 1995

Carrier lifetime limitation defects in polycrystalline silicon ribbons grown on substrate (RGS)

Lu, J. / Rozgonyi, G. A. / Schonecker, A. | British Library Online Contents | 2008

Evaluation of the minority carrier lifetime and diffusion coefficient of cast polycrystalline silicon wafers by the dual mercury probe method

Suzuki, E. / Hayashi, Y. | British Library Online Contents | 1993

Study of PbTe Epitaxial Layers Grown Directly Over Silicon Wafers

Guimaraes, S. / da Silva, S. d. C. F. F. | British Library Online Contents | 2002