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Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
Hytch, M. (Autor:in) / Putaux, J. L. (Autor:in) / Penisson, J. M. (Autor:in)
MATERIALS SCIENCE FORUM ; 482 ; 39-44
01.01.2005
6 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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