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Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography
Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography
Strain mapping in MOSFETS by high-resolution electron microscopy and electron holography
Hue, F. (Autor:in) / Hytch, M. (Autor:in) / Houdellier, F. (Autor:in) / Snoeck, E. (Autor:in) / Claverie, A. (Autor:in)
MATERIALS SCIENCE AND ENGINEERING B ADVANCED FUNCTIONAL SOLID STATE MATERIALS ; 154-155 ; 221-224
01.01.2008
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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