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Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
Nanoscale Measurement of Stress and Strain by Quantitative High-Resolution Electron Microscopy
Hytch, M. (author) / Putaux, J. L. (author) / Penisson, J. M. (author)
MATERIALS SCIENCE FORUM ; 482 ; 39-44
2005-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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