Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling

Baunack, S. / Mudali, U. K. / Gebert, A. | British Library Online Contents | 2005

Characterization of iron oxide layers using Auger electron spectroscopy

Bizjak, M. / Zalar, A. / Panjan, P. et al. | British Library Online Contents | 2007

Electron irradiation effect on depth profiling of a SiO2/Si(100) surface by Auger electron spectroscopy

Yakabe, T. / Fujita, D. / Yoshihara, K. | British Library Online Contents | 2005

Auger electron spectroscopy investigation of sputter induced altered layers in SiC by low energy sputter depth profiling and factor analysis

Kosiba, R. / Ecke, G. / Liday, J. et al. | British Library Online Contents | 2003

Auger electron depth profiling of the Cr/Al~2O~3 metallization system

Lu, H. / Cui, Y. D. / Qin, J. et al. | British Library Online Contents | 1996