Metastable interface defects generated by Fowler-Nordheim tunneling and photoinjection at low temperatures

Sung, Janmye | TIBKAT | 1988

MOSFET drain current reduction under Fowler-Nordheim and channel hot carrier injection before gate oxide breakdown

Gerardin, S. / Cester, A. / Paccagnella, A. et al. | British Library Online Contents | 2004

Vertical SiGe-based silicon-on-nothing (SON) technology for sub-30nm MOS devices

Thompson, P. E. / Jernigan, G. / Schulze, J. et al. | British Library Online Contents | 2005

Values of Fowler-Nordheim field emission functions -- V(y), t(y), and s(y)

Miller, H.C. | Engineering Index Backfile | 1966

Electron tunneling through chemical oxide of silicon

Hattori, T. / Watanabe, K. / Ohashi, M. et al. | British Library Online Contents | 1996