Study on the Surface and Subsurface Integrity of Ground Monocrystalline Silicon Wafers

Kang, R. K. / Zhang, Y. X. / Guo, D. M. et al. | British Library Online Contents | 2005

Study of the Brittle Fracture of Monocrystalline Silicon Wafers

Barredo, J. / Fraile, A. / Alarcon, E. | British Library Conference Proceedings | 2005

Microstructure studies of the grinding damage in monocrystalline silicon wafers

Zhang, Y. / Kang, R. / Guo, D. et al. | British Library Online Contents | 2007

Raman microspectroscopy study of a C/c composite

Chollon, G. / Takahashi, J. | British Library Online Contents | 1999

Method of Examining Surface Cracks on Monocrystalline Silicon

Fang, F.Z. / Liu, Y.C. / Pei, Q.X. et al. | British Library Online Contents | 2008