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High-resolution picosecond acoustic microscopy for non-invasive characterization of buried interfaces
High-resolution picosecond acoustic microscopy for non-invasive characterization of buried interfaces
High-resolution picosecond acoustic microscopy for non-invasive characterization of buried interfaces
Ramanathan, S. (Autor:in) / Cahill, D. G. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 21 ; 1204-1208
01.01.2006
5 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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