Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source
Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source
Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source
Aimoto, K. (Autor:in) / Aoyagi, S. (Autor:in) / Kato, N. (Autor:in) / Iida, N. (Autor:in) / Yamamoto, A. (Autor:in) / Kudo, M. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 6547-6549
01.01.2006
3 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Metal-assisted SIMS and cluster ion bombardment for ion yield enhancement
British Library Online Contents | 2008
|Organic SIMS with single massive gold projectile: Ion yield enhancement by silver metallization
British Library Online Contents | 2006
|ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source
British Library Online Contents | 2006
|British Library Online Contents | 2004
|Secondary ion measurements for oxygen cluster ion SIMS
British Library Online Contents | 2006
|