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    Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

    New search for: Aimoto, K.
    New search for: Aoyagi, S.
    New search for: Kato, N.
    New search for: Iida, N.
    New search for: Yamamoto, A.
    New search for: Kudo, M.

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    Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

    New search for: Aimoto, K.
    New search for: Aoyagi, S.
    New search for: Kato, N.
    New search for: Iida, N.
    New search for: Yamamoto, A.
    New search for: Kudo, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

    New search for: Aimoto, K.
    New search for: Aoyagi, S.
    New search for: Kato, N.
    New search for: Iida, N.
    New search for: Yamamoto, A.
    New search for: Kudo, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Evaluation of secondary ion yield enhancement from polymer material by using TOF-SIMS equipped with a gold cluster ion source

    Contributors:

    Aimoto, K. (author) / Aoyagi, S. (author) / Kato, N. (author) / Iida, N. (author) / Yamamoto, A. (author) / Kudo, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 6547-6549

    Publication date:

    2006-01-01

    Size:

    3 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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