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Steady-state Cs surface concentration on Si and Ge after low energy Cs+ bombardment by SIMS
Steady-state Cs surface concentration on Si and Ge after low energy Cs+ bombardment by SIMS
Steady-state Cs surface concentration on Si and Ge after low energy Cs+ bombardment by SIMS
Chen, P. (Autor:in) / Janssens, T. (Autor:in) / Vandervorst, W. (Autor:in)
APPLIED SURFACE SCIENCE ; 252 ; 7239-7242
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
621.35
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