Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Structural and Morphological Properties of Ultrathin HfO~2 Dielectrics on 4H-SiC (0001)
Structural and Morphological Properties of Ultrathin HfO~2 Dielectrics on 4H-SiC (0001)
Structural and Morphological Properties of Ultrathin HfO~2 Dielectrics on 4H-SiC (0001)
Tanner, C. M. (Autor:in) / Lu, J. (Autor:in) / Blom, H. O. (Autor:in) / Chang, J. P. (Autor:in) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
Silicon Carbide and Related Materials - 2005 ; 1075-1078
MATERIALS SCIENCE FORUM ; 527/529
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Structural properties of ultrathin Pb layers on Ru(0001) revealed by LEED, AES and DFT
| British Library Online Contents | 2014
Magnetic properties of ultrathin Co(0001) films on vicinal Si(111) substrate
| British Library Online Contents | 2008
Growth of Ultrathin Ag Films on 4H-SiC(0001)
| British Library Online Contents | 2004
Growth, Morphological and Structural Properties of Ag Thin Films on a Ru (0001) Surface Grown by MBE
| British Library Online Contents | 2004
Ultrathin HfO2 gate dielectrics on partially strain compensated SiGeC/Si heterostructure
| British Library Online Contents | 2004