Deep Traps in 4H-SiC MOS Capacitors Investigated by Deep Level Transient Spectroscopy

Sveinbjomsson, E.O. / Gislason, O. | British Library Online Contents | 2014

Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers

Huh, S. W. / Sumakeris, J. J. / Polyakov, A. Y. et al. | British Library Online Contents | 2006

Deep level transient spectroscopy studies of undoped and Sn-doped Al~xGa~1~-~xAs epilayers grown by liquid-phase epitaxy

Jothilingam, R. / Saravanan, S. / Baskar, K. | British Library Online Contents | 1996

Characterization of Traps in GaN pn Junctions Grown by MOCVD on GaN Substrate Using Deep-Level Transient Spectroscopy

Tokuda, Y. / Matsuoka, Y. / Ueda, H. et al. | British Library Online Contents | 2009

Defect Evolution in Proton-Irradiated 4H SiC Investigated by Deep Level Transient Spectroscopy

Leveque, P. / Martin, D. / Svensson, B. G. et al. | British Library Online Contents | 2003