Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers
Huh, S. W. (Autor:in) / Sumakeris, J. J. (Autor:in) / Polyakov, A. Y. (Autor:in) / Skowronski, M. (Autor:in) / Klein, P. B. (Autor:in) / Shanabrook, B. V. (Autor:in) / O Loughlin, M. J. (Autor:in) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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Evaluation of Long Carrier Lifetimes in Very Thick 4H-SiC Epilayers
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Impact of Carrier Lifetimes on Non-Destructive Mapping of Dislocations in 4H-SiC Epilayers
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Deep Hole Traps in As-Grown 4H-SiC Epilayers Investigated by Deep Level Transient Spectroscopy
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