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Identification of Deep Level Defects in SiC Bipolar Junction Transistors
Identification of Deep Level Defects in SiC Bipolar Junction Transistors
Identification of Deep Level Defects in SiC Bipolar Junction Transistors
Lenahan, P. M. (Autor:in) / Pfeiffenberger, N. T. (Autor:in) / Pribicko, T. G. (Autor:in) / Lelis, A. J. (Autor:in) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
01.01.2006
4 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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